welcome

We invite you to browse our site and take a look at our crisp TEM images on our portfolio page. We specialize in TEM Analysis of just about any material or substrate, whether semiconductor, metal, nanoparticle, composite, nanocomposite, ceramic or glass.
When you are ready to move forward with your analysis, please send us an email to info@tem-analysis.com or submit a webform on the contact page or give us a call at 817-764-2141 (you can also contact us if you have any questions or just to say hello).
We have years of experience and we know what we are doing. Our head analyst has been performing TEM services for over 29 years. We believe we offer the best value in quality TEM analysis services and we guarantee your satisfaction or we will refund your payment in full.
For a limited time, TEM ANALYSIS SERVICES is offering a 10% discount for new clients for TEM Analysis Services. Please take a look around and get a feel for the quality of our TEM Services.
 

Services

› Structural analysis of materials. (We have significant experience with Si, GaAs and other semiconductors).
› Nanoparticle characterization for size and morphology.
› Thickness measurement of superlattice in III-V materials as well as SL quality.
› Analysis of film quality and thickness measurement of the layers of materials.
› TEM analysis of metals, for evaluation of grain size, structure, and intergranular material, triple points, etc.
› TEM analysis imaging of defects, phases and impurities within materials.
› Sample preparation and other special requests (please contact us with your request).
› HRTEM imaging of defects, interfaces and impurities within materials.
› STEM/HAADF imaging of materials.

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WHY TEM ANALYSIS?

1

TEM imaging is excellent for structural analysis (ie: the visualization and identification of structure and defects in semiconductors, ceramics, metals and other materials). It is also useful for the identification of impurities. It is also extremely useful for very accurate thickness measurement of thin layers and for phase identification.

2

TEM typically has higher resolution than SEM and is the type of imaging that we specialize in. TEM requires a very thin specimen so the electrons can transmit (pass) through the specimen. Specimen thinning is typically a mechanical and/or ion thinning process brought about by bombarding a specimen with high energy ions.

 

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