TEM Analysis and related fields blog
Here is where we will highlight the latest developments in electron microscopy, and provide profiles of companies in the electron microscopy, materials characterization and related fields.
August 24, 2017 - Hitachi High Technology Announced the release of a new FIB/SEM EthosS FIB-SEM that uses magnetic/electrostatic lenses that enables it to deliver advanced imaging performance. It also encorporates Hitachi's Anti-Curtaining Effect (ACE) technologies that suppress curtaining effects or striations during cross-section sample preparation. You can learn more about the product here: Hitachi High Technology
August 23, 2017 - STAR Cryoelectronics An innovative company that fabricates and manufactures a multitude of cryoelectronic systems including a next generation microcal EDS system that offer very high count rates 10kcps and does not require the use expensive and inconvenient liquid nitrogen as well Superconducting QUantum Interference Device (SQUID) sensors. You can learn more about them here: STAR Cryoelectronics
July 30, 2017 - Oregon Physics supports FIB instrument manufacturers and end-users in R&D and industry, with high quality advanced solutions related to FIB technology. including high performance electron and ion guns. They also supply consumable, yet custom parts, such as high performance aperture strips for the FEI FIB's. They also supply replacement FIB consumables for maintaining optimal FIB performance. Additionally, they have an Xe Plasma FIB contract lab, which is available to perform outside work. Their FIB delivers very fast ion beam milling rates, while maintaining the precision and beam placement accuracy inherent with conventional focused ion beams. You can learn more about them here: Oregon Physics
July 30, 2017 - Nion STEM microscopes is a manufacturer of state of the art scanning-transmission electron microscopes (STEM's) with several unique features. Their column design is able to deliver better than 10nm resolution imaging as well as fast nanoanalysis using an atom-sized electron probe with > 0.5 nA of current. It can capable of producing high-quality diffraction patterns and conventional TEM images. Several models are available. Below is a typical STEM image. They are based in Kirkland, Wa. You can learn more about them here: Nion UltraSTEM Microscopes
July 23, 2017 - Microscopy and Microanalysis is coming to St. Louis August 6-10. This is the annual week long meeting where scientists, technicians, university professors and students gather to learn, socialize and discuss all topics related to light, electron and other microscopies and microanalysis. There will thousands of attendees and scores of vendors at attendance. This is a great opportunity to immerse yourself in all things microscopy. For more information click here